
Engineering Precision for Next-Generation Power Electronics.
Specialist in power semiconductor embedding, advanced fabrication processes, and high-performance current sensor development. With nearly a decade of engineering experience, he combines technical depth with a strong focus on quality, efficiency, and manufacturing excellence.
About
With close to ten years of hands-on experience in the field of power semiconductor embedding, I am dedicated to pushing the boundaries of modern power electronics. My work spans the complete process chain—from fabrication technologies and process optimization to the development of high-accuracy current sensors for demanding applications.
Driven by a passion for precision and technological innovation, I strive to create solutions that enhance the performance, reliability, and manufacturability of next-generation power electronics.
In my current role within a high-tech startup, I am responsible for:
- Quality assurance
- Process optimization
- Evaluation of fabrication workflows
- Implementation of robust engineering standards
- Continuous improvement strategies in semiconductor processing
My mission: to build the technical foundations that enable efficient, scalable, and future-ready power electronic systems.
Knowledge
Power Semiconductor Embedding
- Development and optimization of embedding technologies
- Material selection and interface engineering
- Reliability-driven process design
Fabrication Process Development
- End-to-end fabrication workflows
- Process stabilization & repeatability
- Identification and elimination of bottlenecks
Quality Assurance in Power Electronics
- Inspection strategies & defect analysis
- Root cause analysis and corrective actions
- Statistical process control (SPC)
High-Performance Current Sensor Development
- Sensor architecture & layout concepts
- Optimization for accuracy, bandwidth, and thermal stability
- Integration into advanced power electronic systems
Continuous Improvement & Industrialization
- Lean process strategies
- Scalability planning for manufacturing
- Cross-functional engineering collaboration
Professional Experience
Scientific Assistant
University of Applied Sciences Kempten · Full-time
Nov 2017 – Oct 2025 · 8 years
- PCB design and fabrication
- Semiconductor embedding and characterization (Si, SiC, GaN)
- Development and testing of power electronic modules
- Support for research and laboratory activities in electronics integration
Test Engineer
NAVIgard · Full-time
Apr 2016 – Sept 2016 · 6 months
- Testing and evaluation of security and access control systems
- Functional verification of CCTV and electronic security components
- Performance analysis and troubleshooting within R&D workflows
Education
Master of Engineering (MEng), Electrical Engineering
University of Applied Sciences Kempten
Oct 2016 – July 2018
- Final grade: 1.9
- Activities: Electronics Integration Laboratory (EI-Lab), International Club
Certificate of Exchange Studies – Engineering Physics / Applied Physics
University of Łódź
Oct 2015 – Feb 2016
- GPA: 92%
- Activities: International Club
- Coursework included: Nanoelectronics, Microprocessors Systems, Modern Physics Methods, Semiconductor Fundamentals, Experimental Techniques
Team
Latest M-SHUNT related Publications
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Characterising Wide Bandgap Power Modules: Validating the M-Shunt Concept for High-Power Applications in the Kiloampere Range
H. Lutzen, J. Müller, V. Polezhaev, S. Chemnitz, M. Arndt, L. Dittmer, T. Huesgen and N. Kaminski
in PCIM Europe 2024 – International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg, Germany
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A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices
H. Lutzen, J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski
in EPE’23 ECCE Europe – 25th European Conference on Power Electronics and Applications, Aalborg, Denmark
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Reducing the Impact of Skin Effect Induced Measurement Errors in M-Shunts by Deliberate Field Coupling
H. Lutzen, J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski
in EPE’22 ECCE Europe – 24th European Conference on Power Electronics and Applications, Hanover, Germany
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Temperature Compensated M-Shunts for Fast Transient and Low Inductive Current Measurements
H. Lutzen, V. Polezhaev, K. B. Rawal, K. Ahmmed, T. Huesgen and N. Kaminski
in CIPS 2022 – 12th International Conference on Integrated Power Electronics Systems, Berlin, Germany

