Temperature Compensated M-Shunts for Fast Transient and Low Inductive Current Measurements

Written by

in

H. Lutzen, V. Polezhaev, K. B. Rawal, K. Ahmmed, T. Huesgen and N. Kaminski

in CIPS 2022 – 12th International Conference on Integrated Power Electronics Systems, Berlin, Germany

Hauke Lutzen Nando Kaminski Till Huesgen Vladimir Polezhaev

More posts

On the Importance of Appropriate Current Probes for Double Pulse Tests and How to Select Them

2025-06-30
Characterising Wide Bandgap Power Modules: Validating the M-Shunt Concept for High-Power Applications in the Kiloampere Range

2024-06-30
Why the 3 dB Bandwidth of a Current Sensor Does Not Provide an Exact Statement About Its Measurement Capability

2024-03-31
A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices

2023-09-30