Past Events

At the International Conference on Integrated Power Electronics Systems (CIPS), Vladimir Polezhaev will present the publication “Design, fabrication and testing of a novel 650V / 10 mΩ GaN embedded Half-bridge-in-Package (eHiP) with optimized thermal performance and low parasitics“, while Hauke Lutzen will present “From Insight into Bandwidth to Fast-Transient Precision: Diamond-M-Shunts for Wideband Current Measurement“.

For more information, please refer to: CIPS website

The M-Shunt project from the Institute for Power Electronics and Electrical Drives (IALB) at the University of Bremen and EI-Lab from University of Applied Sciences Kempten has been awarded first place in the “Business Concepts” category at CAMPUSiDEEN 2025. The competition, organized by “BRIDGE – Gründen aus Bremer Hochschulen”, recognizes outstanding business ideas from all universities in Bremen. The award highlights the innovative measurement technology developed by the research-based founding team and marks an important milestone on the path toward market readiness.

Please find the articles online: BRIDGE IALB

Hauke Lutzen was a co-author of the paper “On the Importance of Appropriate Current Probes for Double Pulse Tests and How to Select Them” from S. Sprunck together with N. Kaminski, and M. Jung.

Hauke Lutzen pulished “Characterising Wide Bandgap Power Modules: Validating the M-Shunt Concept for High-Power Applications in the Kiloampere Range” together with J. Müller, V. Polezhaev, S. Chemnitz, M. Arndt, L. Dittmer, T. Huesgen and N. Kaminski.

Hauke Lutzen published “Why the 3 dB Bandwidth of a Current Sensor Does Not Provide an Exact Statement About Its Measurement Capability” together with P. Ziegler, J. Roth-Stielow and N. Kaminski.

Hauke Lutzen published “A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices” together with J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski

Hauke Lutzen published “Reducing the Impact of Skin Effect Induced Measurement Errors in M-Shunts by Deliberate Field Coupling” together with J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski

Hauke Lutzen published “Temperature Compensated M-Shunts for Fast Transient and Low Inductive Current Measurements” together with V. Polezhaev, K. B. Rawal, K. Ahmmed, T. Huesgen and N. Kaminski

Hauke Lutzen published “Optimisation and Proof of Concept Studies for the M-Shunt Structure Applied to Printed Circuit Boards” together with K. Mitsui, D. Silber, K. Wada and N. Kaminski on the online conference.