Conferences

At the International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM), Hauke Lutzen will present the publication “Pushing the Boundaries of Miniaturisation in Current Sensing: Ultra-Compact Mini-M-Shunts for faster transients“.

Visitors are invited to meet our team in Hall 6 at Booth 419 during the exhibition to discuss the latest developments in ultra-compact current sensing solutions and explore how our Mini-M-Shunts enable improved performance in high-speed, high-efficiency power electronics applications.

For more information, please refer to: PCIM website

At the International Conference on Integrated Power Electronics Systems (CIPS), Vladimir Polezhaev will present the publication “Design, fabrication and testing of a novel 650V / 10 mΩ GaN embedded Half-bridge-in-Package (eHiP) with optimized thermal performance and low parasitics“, while Hauke Lutzen will present “From Insight into Bandwidth to Fast-Transient Precision: Diamond-M-Shunts for Wideband Current Measurement“.

For more information, please refer to: CIPS website

Hauke Lutzen was a co-author of the paper “On the Importance of Appropriate Current Probes for Double Pulse Tests and How to Select Them” from S. Sprunck together with N. Kaminski, and M. Jung.

Hauke Lutzen pulished “Characterising Wide Bandgap Power Modules: Validating the M-Shunt Concept for High-Power Applications in the Kiloampere Range” together with J. Müller, V. Polezhaev, S. Chemnitz, M. Arndt, L. Dittmer, T. Huesgen and N. Kaminski.

Hauke Lutzen published “Why the 3 dB Bandwidth of a Current Sensor Does Not Provide an Exact Statement About Its Measurement Capability” together with P. Ziegler, J. Roth-Stielow and N. Kaminski.

Hauke Lutzen published “A Review of Current Sensors in Power Electronics: Fundamentals, Measurement Techniques and Components to Measure the Fast Transients of Wide Bandgap Devices” together with J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski

Hauke Lutzen published “Reducing the Impact of Skin Effect Induced Measurement Errors in M-Shunts by Deliberate Field Coupling” together with J. Müller, V. Polezhaev, T. Huesgen and N. Kaminski

Hauke Lutzen published “Temperature Compensated M-Shunts for Fast Transient and Low Inductive Current Measurements” together with V. Polezhaev, K. B. Rawal, K. Ahmmed, T. Huesgen and N. Kaminski

Hauke Lutzen published “Optimisation and Proof of Concept Studies for the M-Shunt Structure Applied to Printed Circuit Boards” together with K. Mitsui, D. Silber, K. Wada and N. Kaminski on the online conference.